Utilizing Secondary Ion Mass Spectrometry (SIMS) for in-line metrology is a newly emerging method of process control that requires contamination-free measurements, enabling SIMS on product wafers.

Note: This video is designed to help the teacher better understand the lesson and is NOT intended to be shown to students. It includes observations and conclusions that students are meant to make on ...

Scientists develop positive electrode material using an organic redox polymer based on phenothiazine. Aluminium-ion batteries containing this material stored an unprecedented 167 milliampere hours per ...