The foundation of parametric test within semiconductor manufacturing is its usefulness in determining that wafers have been fabricated properly. Foundries use parametric test results to help verify ...
SANTA ROSA, Calif.--(BUSINESS WIRE)-- Keysight Technologies, Inc. (NYSE: KEYS), a leading technology company that delivers advanced design and validation solutions to help accelerate innovation to ...
Keithley Instruments Inc has announced availability of a single-insertion RF and DC parametric test solution for probing wafers of processed communications and high-speed digital devices The S400DC/RF ...
The reference or demodulated signal can be predetermined and stored as part of the test program. One method using EVM not only makes it possible to increase test coverage via system-level testing, but ...
Tektronix, Inc., a leading worldwide provider of test and measurement solutions, released the new Keithley S530 Series Parametric Test System with KTE 7 software and other enhancements. The S530 ...
To improve yield, quality, and cost, two separate test parameters can be combined to determine if a part passes or fails. The results gleaned from that approach are more accurate, allowing test and ...
This is a preview. Log in through your library . Abstract We are interested in the problem of robust parametric estimation of a density from n i.i.d. observations. By using a practice-oriented ...
Market research cited Marsh indicated the global parametric insurance market is estimated to reach $34.4 billion by 2033. While natural catastrophe remains dominant, parametric models are increasingly ...
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