As the final step in the production process, inspection is of critical importance to the manufacturing industry. Manufacturers generally allot adequate staff resources to perform inspection for the ...

Advanced machine learning is beginning to make inroads into yield enhancement methodology as fabs and equipment makers seek to identify defectivity patterns in wafer images with greater accuracy and ...

Advanced LED lighting arrays can spectrally tune their output wavelength to highlight different features and defects in captured images. The capability enables a single light fixture to quickly adapt ...