Investing in automated testing and DevOps development services strengthens your software while future-proofing your business.

Most testing strategies collapse under the weight of modern software development demands. But speed requirements continue to increase while application complexity grows, which creates an impossible ...

FREDERICK, Md.--(BUSINESS WIRE)-- Spirent Communications plc (LSE:SPT), a leading provider of test and assurance solutions for next-generation devices and networks, today announced the release of the ...

Web and mobile testing company BrowserStack Inc. today announced the launch of BrowserStack AI, a suite of artificial intelligence agents designed to automate and enhance every stage of the software ...

When the first computer bug was discovered in 1947, it was quite literally a moth that had become trapped inside a system at Harvard University that was disrupting the electronics. At that time, the ...

EAST HARTFORD, CT and PAWTUCKET, RI –Telesis, LLC, a software automation testing company to the insurance industry, announced that it has successfully completed the software test automation for ...

In today's fast-paced world of software development, automation has become a cornerstone of testing, ensuring quality and efficiency amidst increasingly complex applications. With faster release ...

Value stream management involves people in the organization to examine workflows and other processes to ensure they are deriving the maximum value from their efforts while eliminating waste — of ...

He's not alone. AI coding assistants have compressed development timelines from months to days. But while development velocity has exploded, security testing is often stuck in an older paradigm. This ...

MILWAUKEE--(BUSINESS WIRE)--Rockwell Automation (NYSE:ROK), the world’s largest company dedicated to industrial automation and digital transformation, will debut its new Emulate3D® Factory Test™ ...

The U.S.-based metrology equipment manufacturer has launched a non-contact photoluminescent imaging system to reveal defects and other non-uniformities in silicon, thin film, and III-V multijunction ...